拆分测试集到芯片和测试仪上的新技术

项目名称： 拆分测试集到芯片和测试仪上的新技术

项目编号： No.61472123

项目类型： 面上项目

立项/批准年度： 2015

项目学科： 自动化技术、计算机技术

项目作者： 邝继顺

作者单位： 湖南大学

项目金额： 80万元

中文摘要： 测试激励压缩TSC和内建自测试BIST是两种重要的减少测试数据的方法，可降低芯片成本、做现场测试，对提高产品质量、保证系统正常运行有重要意义。首次注意到填充无关位给改变确定位的值带来的机会；提出有损TSC，颠覆了传统观念，为相关工作提供了全新的视角，惠及所有TSC技术，有巨大潜力，可大幅提高压缩率；将TSC与BIST统一在新的框架下，适用于生产与现场测试，能大幅缩短BIST的测试应用时间。方法是将被压缩的原测试集拆分成主分量集和残分量集，前者简单、放在芯片上、由片上电路生成，后者可修改或允许失真，经大幅压缩后存放在测试仪上。实施测试时两者分别在片上生成、解压缩最后合成为原测试集。研究理论最佳变换、最佳变换具体实现、最小化残分量集快速算法、残分量集逼近及应用到主流测试压缩技术，具有审慎的全局观和高度的灵活性。关键问题为创建最佳正交变换、研究残分量集快速最小化算法和减少BIST的测试应用时间。

中文关键词： 集成电路测试；测试数据压缩；内建自测试；有损压缩；向量分解

英文摘要： Test stimulus compression and built-in self-test are two important techniques for reducing test data, which benefits to low the cost of IC test, implement field test, and is significant to enhance product quality, guarantee systems be in normal operation. The proposal takes note of the opportunity brought by filling don't care bits for changing the value of the specified bits. The proposal first presents an idea of lossy test stimulus compression, which topples down the convention opinion. The idea gives a novel new angle of view for the related works, favours almost all test stimulus compression methods, and is expected to get much high compression ratio. For being available in product test and field test, the proposal combines the test stimulus compression with the built-in self-test together, and can greatly reduce the test application time of BIST. The original test set is decomposed into an essential component set and a residual component set, where the former is simple, produced on the chip, and the latter can be modified, stored on the tester after being much compressed. When the test is carried on both of them are generated on the chip, decompressed, respectively, and composed to the original test set again.The best transform, the implementation of the best fransform, quickly minimizing the residual component set, approaching the residual component set, and applications to the current main test stimulus compression are investigated. The key problems are to create a best transform, development a fast algorithm for minimizing the residual component set, and reduce the test application time of BIST.

英文关键词： IC Test;Test Data Compression;Built-In Self-Test;Lossy Compression;Vector Decomposition