基于老化特征的集成电路失效预测与防护

项目名称： 基于老化特征的集成电路失效预测与防护

项目编号： No.61274036

项目类型： 面上项目

立项/批准年度： 2013

项目学科： 无线电电子学、电信技术

项目作者： 梁华国

作者单位： 合肥工业大学

项目金额： 83万元

中文摘要： 集成电路特征工艺尺寸不断缩小的同时，电路的老化速度也在加剧，严重影响了集成电路的使用寿命和可靠性。本课题以集成电路老化失效预测和防护为切入点，主要研究内容包括：⑴基于自振荡回路的老化失效预测。选择老化敏感的特征通路，利用自身电路构建自振荡回路，通过老化特征计数器捕获老化特征，度量老化程度，预测电路失效。⑵复用自测试电路的老化恢复。利用已有的内建自测试结构生成和施加电路老化恢复向量，实现电路老化的自恢复。⑶电路参数的自适应在线调整。根据电路老化特征值，在线精确调整电路的供电电压和工作频率，保证电路的可靠运行。⑷采用时-空冗余技术的电路老化故障容忍。利用多时钟技术和冗余单元修正老化引起的电路故障，避免电路老化失效的发生。 本研究将有效延长电子产品的生命周期，降低电路的维护成本，提高电路的可靠性，具有很强的理论和应用价值。

中文关键词： 电路老化；老化检测；老化缓解；电路失效；可靠性

英文摘要： As technology being improved rapidly, aggravating circuit aging has caused a new challenge for the reliability. This research focuses on the problem of failure prediction and protection for circuits. The main research objects are as follows.(1)Aging failure prediction using self-oscillating loop. It selects aging sensitive data paths from circuits，constructs self-oscillating loop for them using their own devices and uses a specific aging signature counter to measure the aging degree and predict circuit failure.(2)Recovering aged circuit by the reusing of self-testing structure. It focuses on the process of reusing self-testing circuits to construct an effective aging recovery mechanism.(3)Adaptive online self-scaling for circuits. It researches on the dynamical method with precisely self-scaling of operating conditions such as supply voltage and clock frequency, according to the aging signatures of circuits.(4)Aging fault tolerance using time-space redundancy method. It researches on the method to correct faults resluting from circuit aging by combining multi-clock technique and redundant circuits. The research on failure prediction and protection for circuits could effectively extend the life-time and reduce the maintenance cost of electronic production, and it is also meaningful to improve the circuits rel

英文关键词： circuit aging；aging detection；aging remission；circuit failure；reliability