CASES:International Conference on Compilers, Architectures, and Synthesis for Embedded Systems。 Explanation:嵌入式系统编译器、体系结构和综合国际会议。 Publisher:ACM。 SIT: http://dblp.uni-trier.de/db/conf/cases/index.html

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The quest of `can machines think' and `can machines do what human do' are quests that drive the development of artificial intelligence. Although recent artificial intelligence succeeds in many data intensive applications, it still lacks the ability of learning from limited exemplars and fast generalizing to new tasks. To tackle this problem, one has to turn to machine learning, which supports the scientific study of artificial intelligence. Particularly, a machine learning problem called Few-Shot Learning (FSL) targets at this case. It can rapidly generalize to new tasks of limited supervised experience by turning to prior knowledge, which mimics human's ability to acquire knowledge from few examples through generalization and analogy. It has been seen as a test-bed for real artificial intelligence, a way to reduce laborious data gathering and computationally costly training, and antidote for rare cases learning. With extensive works on FSL emerging, we give a comprehensive survey for it. We first give the formal definition for FSL. Then we point out the core issues of FSL, which turns the problem from "how to solve FSL" to "how to deal with the core issues". Accordingly, existing works from the birth of FSL to the most recent published ones are categorized in a unified taxonomy, with thorough discussion of the pros and cons for different categories. Finally, we envision possible future directions for FSL in terms of problem setup, techniques, applications and theory, hoping to provide insights to both beginners and experienced researchers.

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This paper presents the first general (supervised) statistical learning framework for point processes in general spaces. Our approach is based on the combination of two new concepts, which we define in the paper: i) bivariate innovations, which are measures of discrepancy/prediction-accuracy between two point processes, and ii) point process cross-validation (CV), which we here define through point process thinning. The general idea is to carry out the fitting by predicting CV-generated validation sets using the corresponding training sets; the prediction error, which we minimise, is measured by means of bivariate innovations. Having established various theoretical properties of our bivariate innovations, we study in detail the case where the CV procedure is obtained through independent thinning and we apply our statistical learning methodology to three typical spatial statistical settings, namely parametric intensity estimation, non-parametric intensity estimation and Papangelou conditional intensity fitting. Aside from deriving theoretical properties related to these cases, in each of them we numerically show that our statistical learning approach outperforms the state of the art in terms of mean (integrated) squared error.

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This paper presents the first general (supervised) statistical learning framework for point processes in general spaces. Our approach is based on the combination of two new concepts, which we define in the paper: i) bivariate innovations, which are measures of discrepancy/prediction-accuracy between two point processes, and ii) point process cross-validation (CV), which we here define through point process thinning. The general idea is to carry out the fitting by predicting CV-generated validation sets using the corresponding training sets; the prediction error, which we minimise, is measured by means of bivariate innovations. Having established various theoretical properties of our bivariate innovations, we study in detail the case where the CV procedure is obtained through independent thinning and we apply our statistical learning methodology to three typical spatial statistical settings, namely parametric intensity estimation, non-parametric intensity estimation and Papangelou conditional intensity fitting. Aside from deriving theoretical properties related to these cases, in each of them we numerically show that our statistical learning approach outperforms the state of the art in terms of mean (integrated) squared error.

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